| Manufacturer | Model # | Description | Serial # | Wafer Size |
| ADE | 9350 | Wafer Thickness Measurement System | 9300-0134 | 6¡± |
| Advanced Techniques US Inc. | Pro 1600 | Forced Convection Reflow Oven | 0412-04 | N/A |
| Aetrium | 5050S | Component Test IC Handler w/150 mil Gull Wing Kit on Mobile Stand | 101B | N/A |
| Air Liquide | N/A | Gas Cabinet(s) | Inquire | N/A |
| Alessi | 550 | Analytical Wafer Prober | 55-1879-09 | 8¡± |
| Amray | 2080 | Scanning Electron Microscope | 20302004 | 8¡± |
| Applied Materials | 8115 | **REFURBISHED** Etcher(s) | Inquire | 6¡± |
| Asyst Technologies | ALU 1125/1150 | Mask/Wafer Loader System | 2387-00140 | 6¡± |
| Asyst Technologies | 2200FT | Indexer(s) | Inquire | 8¡± |
| Asyst Technologies | RMS-6 | Reticle Inspection System | 1003869-001 | N/A |
| ATMI / EcoSys | CDO 858 | **BRAND NEW** Effluent Gas Scrubber(s) | CC03101, CC03135 | N/A |
| ATMI / EcoSys | ES-100G9-CA4 | Fume Scrubber | 9803026 | N/A |
| Axcelis / Eaton | GSD P/N 1183060 | Ion Implanter Process Disk(s) | 587RSS, 300RSS | 5¡± |
| Bio-Rad | Q5/Q6 | Overlay Registration Tool ¨C Has been upgraded to Q6 | Q2093 | 6¡± |
| Bio-Rad | Q7/Q8 | Overlay Tool(s) | Q2336/Q2128/Q2087 | 8¡± |
| Blue M | DCA-336G | Oven | Inquire | N/A |
| Blue M | DCC-206C | Parts Bake Oven | DCC-381 | N/A |
| Blue M | OV-510A-2 | Mechanical Convection Horizontal Airflow Oven with Chemical Storage Cabinet | OV3-22834 | Multiple |
| Blue M | POM7-146C-2X | Mechanical Convection Oven with AMF 7-day time switch | Inquire | N/A |
| Branson/IPC | L3100 | Barrel Etcher/Asher | Inquire | 6¡± |
| Branson/IPC | S2100 | Barrel Etcher/Asher | M909010 | 6¡± |
| Buehler | Ecomet 3 | **BRAND NEW** Polisher/Grinder | 570-E3G-04427 | 8¡± |
| Canon | MAS-8000 | Single Wafer Resist Asher(s) | 81452, 81455-9, 81456 | 8¡± |
| CDE | 463-OC | Resistivity Mapper/4-Point Probe | B07322463, B07323463 | 8¡±/12¡± |
| Delatech Inc. | SD500-2 | Fume Scrubber | 33090697 | N/A |
| Delta Design | 2300 | Temperature Chamber with Type V Controller | 0-99-27 | N/A |
| DNS | SC-W60A-AV | **RECONDITIONED** Coater | 55700-6776 | 6¡± |
| DNS | SC-W60A-AVP | **RECONDITIONED** Developer(s) | 55700-6848 / 53700-6433 | 6¡± |
| DNS | SC-W80A-AVFGLP | SOG Furnace for 80A | 54700-2781 | 8¡± |
| Dynatronix | Various | Pulse, Pre Series, Programmable Power Supplies | Inquire | N/A |
| Ebara | Various | Vacuum Dry & Wet Pump(s) | Inquire | N/A |
| Edwards | Various | Vacuum Dry & Wet Pump(s) | Inquire | N/A |
| ERC | ERC-3415 | Four Channel Degasser System | Inquire | N/A |
| Espec | TSB-5 | Thermal Shock Chamber | 171000181 | N/A |
| Express Test | ET.302.P | Autoclave | Inquire | N/A |
| FSI | Mercury | PVDF Turntable(s) | Inquire | 8¡± |
| FSM | 128LC2C | Automated Film Stress & Wafer Bow Measurement | 010531-397 | 8¡±/12¡± |
| FSM | Laminar II | Chip Adhesion Tester | 00309-330 | N/A |
| FSM | 900-TC-VAC | Integrated Metrology Annealing Chamber | 00831-345 | 8¡±/12¡± |
| Gasonics | Aura 1000 | Plasma Asher(s) | Inquire | 6¡± |
| General Electric | SGA040-1-02-N | Digital Energy SG Series UPS | Inquire | N/A |
| Haskris | Various | Chiller(s) | Inquire | N/A |
| Hitachi | S-4500 | **GUARANTEED** FEM/SEM | 7545-03 | 8¡± |
| Hitachi | S-4700 | **GUARANTEED** FEM/SEM | 9312-04 | 4¡± |
| Hitachi | S-6000 | Scanning Electron Microscope | L54235 | 6¡± |
| Hitachi | S-8620 | Scanning Electron Microscope | 8607-01 | 6¡± |
| Hitachi | S-7800/S-8820 | External Power Supply Cabinet | Inquire | N/A |
| Hitachi | IS-3270 | Patterned Wafer Inspection System | 942030 | 6¡± |
| HP | 4145A/B | Parametric Analyzer | Inquire | N/A |
| Hypervision | Chip Unzip | Low Stress Backside Preparation System | Inquire | N/A |
| IDE/Cybeq | OCL 300 | Wafer Transfer/Sorter | 107TS1934 | 8¡±/12¡± |
| Irvine Optical | Ultrastation 150 | Wafer Inspection Station | ¡¡ | 6¡±/8¡± |
| Irvine Optical | Ultrastation 3.B Model 2 | Wafer Inspection Station | Inquire | 6¡±/8¡± |
| Irvine Optical | Ultrastation 3B Model 2 | Wafer Inspection Station | Inquire | 6¡±/8¡± |
| JEOL | JSM-6600FXV (X-vision) | Scanning Electron Microscope | Inquire | 6¡± |
| JEOL | JWS-7505ZH | CD-SEM | WS179022-93 | 8¡± |
| Kinetics Systems | 1208-02-11 | Pneumatic Air Table with Base | Inquire | N/A |
| KLA-Tencor | P-1 | **GUARANTEED** Profilometer | 2900237 | 8¡± |
| KLA-Tencor | P-10 | **GUARANTEED** Profilometer | 0701112462 / 23916 | 8¡± |
| KLA-Tencor | SP-1 Classic | **GUARANTEED** Surface Inspection System(s) | 0602-179 / 0397-118 | 8¡±/12¡± |
| KLA-Tencor | SP-1 | **NEW/NEVER USED** Wafer Loader(s) | 1199-0380 / 1298-0331 | 12¡± |
| KLA-Tencor | Surfscan 4500 | **GUARANTEED** Particle Measurement System(s) | 689-348 | 6¡± |
| KLA-Tencor | Surfscan 6200 | **GUARANTEED** Wafer Surface Inspection System | 1092-203 | 8¡± |
| KLA-Tencor | Surfscan 7600 | Wafer Inspection System | 1294-476 | ¡¡ |
| KLA-Tencor | Surfscan 7700 | Patterned Wafer Inspection System(s) | 0994-450 / 1193-406 / 0396-774 | 8¡± |
| KLA-Tencor | 5011 | Overlay Precision Measurement System | 288 | 6¡± |
| Kokusai | Vertron 2 DD-802V | Vertical Diffusion Furnace | T2DD1-10336 | 6¡± |
| Kokusai | Vertron 5(E) DJ-825V | Vertical Diffusion Furnace | T2DC2-10543 | 6¡± |
| Lab-Line | 3850 SC | Electric Oven | 630211 | N/A |
| LAM / Drytek | 384T | Plasma Metal Etcher(s) | Inquire | 6¡± |
| LAM Research | 490 | Nitride/Poly Etch System | 1368 | 6¡± |
| LAM Research | 4400 | Poly Etcher | 2119 | 8¡± |
| LAM Research | 4500 | Oxide Etcher | 3300 | 8¡± |
| LAM Research | 4520 | Oxide Etcher | 3561 | 8¡± |
| LAM Research | TCP9400SE | **GUARANTEED** Poly Etcher | 4054 | 8¡± |
| LAM Research | TCP9600SE | **GUARANTEED** Metal Etcher | 4357 | 6¡± |
| Leica / Cambridge | S360 | Scanning Electron Microscope | 360-74-02 | 6¡± |
| Leica | StereoZoom4 | Microscope | Inquire | N/A |
| Leitz | 020-448.026 | Transmitted Light Microscope | 43273 | Multiple |
| LEO | 435VP | Scanning Electron Microscope | 68237 | 6¡± |
| Mactronix | AWI-600 | Automatic Wafer Sorter | 970516P720 | 6¡± |
| MDC | 8512-6AU | Semiconductor CV Plotter DUOChuck | 1186-694 | 6¡± |
| MRC | Eclipse Mark 2 | Sputtering System | 13970 | 4¡± |
| Micromanipulator | 8860 | Prober | Inquire | 6¡± |
| Nanometrics | 8300XSE | **GUARANTEED** Film Thickness Analyzer with Spectroscopic Ellipsometry | 1199-0032, 0599-0028 | 8¡±/12¡± |
| Nanometrics | 9000i | Integrated Film Analysis System(s) | 9000-0403-0246, 9000-0403-0244, 9000-0400-0063 | 8¡±/12¡± |
| Nanometrics | Nanoline 50-2 | CD Measurement System | 0694-H9024NL | 6¡± |
| Nanometrics | NanoSpec 212 | Film Thickness | 8074 | 6¡± |
| Neslab | Various | Chiller(s) | Inquire | N/A |
| Nicolet | 205 | Spectrometer FT-IR | AAC9300818 | 6¡± |
| Nikon | Nikon Metaphot | Microscope | 52293-8 | N/A |
| Nikon | 6 | Mask Comparator | 64225 | N/A |
| Novellus | C1-W(200) | CVD Tungsten | 96-07-2081 | 8¡± |
| Olympus | 300702 | Table Inspection Microscope | Inquire | N/A |
| Olympus | AL100 | Wafer Loader | K603002 | 8¡± |
| Olympus | BH | Microscope | 854296 | N/A |
| Philips | PW-2800 | X-Ray Fluorescent Inspection System | DY591 | 8¡± |
| Plas Mos | SD 2000 | Automatic Ellipsometer | 50970894 | 4¡±/8¡± |
| Polyflow Engineering | S-417 | Triple Tower Quartz Tube Cleaner | 16324 | 6¡± |
| Prometrix | FT-750 | Patterned Wafer Mapping System(s) | 960254FT750, 951155FT700 / 5000 | 8¡± |
| Prometrix | RS-35c | Resistivity Mapping System | 9304RS35C-03 | ¡¡ |
| QC Optics | API-4000 | Photo Mask Inspection Station | 347 | N/A |
| RECIF | VMT8 | Wafer Sorter/Handler | 127 | 8¡± |
| RECIF | BPP8 | Wafer Sorter/Handler | 262 | 8¡± |
| Reliability, Inc. | CR1-B | Burn-In Oven | 62581 | N/A |
| Rigaku | 3700H TXRF | X-Ray Spectrometer | PR490123700H | 8¡± |
| Rigaku | DPGS | X-Ray Cut Surface Inspection Machine | Inquire | ¡¡ |
| Rigaku | Wafer X-300 | X-Ray Fluorescence System | UR71003 | 6¡±-12¡± |
| Rucker & Kolls | 210/260/660J/683A | Manual & Semi-Automatic Wafer Prober(s) | Various | 6¡± |
| Rudolph | Metapulse 300 | Film Thickness Measurement System | 1-07-MPO-1024-AU-01 | 8¡±/12¡± |
| Sagitta | NEXT-1 System | Automatic Cross-Sectioning Polisher | 1112-2000 | 8¡± |
| Schumacher | CG100 | TEOS Bulk Delivery System Cabinet | B722020310 | N/A |
| SDI | FAaST 330-DP+USPV+SILC | **GUARANTEED** Surface Voltage Test System | 01-100283 | 8¡± / 12¡± |
| Semifab | CD200+2 | Environmental Control System(s) | 6110-01/5851-04/5011-04 | N/A |
| Semitherm | VTP Express | Vertical Diffusion Furnace(s) | Inquire | 8¡± |
| Semitool | SAT106 | Spray Acid Cleaner/Aqua Regia | G80489 | 6¡± |
| Semix/Tazmo | 6132UD | SOG Coater(s) | 622322/626335 | 6¡± |
| Semix/Tazmo | TR-6133UD | SOG Coater(s) | 664450/667454 | 6¡± |
| SEZ | 223 | Dual Chamber Single Wafer Spin Processor | 693 | 8¡± |
| SEZ | 304 | Single Chamber Single Wafer Spin Processor | 494 | 12¡± |
| SVG / ASML / AVIZA | RVP9507TOX-DB RVP | Vertical Oxide Diffusion Furnace | R10069 | 6¡± |
| SVG / Thermco | Series 8000 AVP-16 | Vertical Diffusion Furnace | 4129 | 6¡± |
| SVG / Thermco | VTR-7000 | LPCVD Vertical Diffusion Furnace(s) | V7-406 / V7-248 | 8¡± |
| Tamar Technologies | CD Measure | Critical Dimension Measurement System | 9232 | 6¡± |
| TEL | Alpha-8SE-E | Vertical Oxide Diffusion Furnace | M00009995116 | 8¡± |
| ATPf | ||||
| TEL | Alpha 8-SE | LPCVD Vertical Diffusion Furnace | M00009985071 | 8¡± |
| Temptronic | TP04000A-2021-2 | Airstream System | 9410450 | N/A |
| Temptronic | TP452A-1 | Thermostream System | Inquire | N/A |
| Teradyne | SPARC A540 | Automatic Test System | 9203250 | N/A |
| Teradyne | J973 | Automatic Test System(s) | Inquire | N/A |
| Thermo GasTech | Safe T Net 2000 | Gas Sensor(s) with Rittal Cabinet(s) | Inquire | N/A |
| UltraPointe | 1010 | Laser Imaging System | 31 | 6¡± |
| Wild | M420 | Transmitted Light Microscope | Inquire | N/A |